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30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems

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30th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Dates of Event
23rd October 2017 – 25th October 2017
Last Booking Date for this Event
25th October 2017
Description

DFT2017

DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.

Author Registration Deadline: 4 August 2017.

Early Registration Deadline for Other Delegates: 22 September 2017

http://www.dfts.org/